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1

Laser photo-reflectance characterization of resonant nonlinear electro-refraction in thin semiconductor films

Will Chism, Jason Cartwright

Journal:

Thin Solid Films

Year:

2012

Language:

english

File:

PDF, 410 KB

english, 2012

2

Rydberg atoms in circular polarization: Classical stabilization in optical frequency fields

Chism, Will, Reichl, L. E.

Journal:

Physical Review A

Year:

2002

Language:

english

File:

PDF, 172 KB

english, 2002

3

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Photo-Reflectance Characterization of Nanometer Scale Active Layers in Si

Chism, Will, Pham, Daniel, Allgair, John, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secula, Erik M.

Year:

2007

Language:

english

File:

PDF, 1.01 MB

english, 2007

4

Intense field stabilization in circular polarization: Three-dimensional time-dependent dynamics

Choi, Dae-Il, Chism, Will

Journal:

Physical Review A

Year:

2002

Language:

english

File:

PDF, 114 KB

english, 2002

5

Z -scanning laser photoreflectance as a tool for characterization of electronic transport properties

Journal:

Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 623 KB

english, 2018

6

Photoreflectance characterization of ultrashallow junction activation in millisecond annealing

Chism, Will, Current, Michael, Vartanian, Victor

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2010

Language:

english

File:

PDF, 1016 KB

english, 2010

7

Classical origins of stabilization in circularly polarized laser fields

Chism, Will, Choi, Dae-Il, Reichl, L. E.

Journal:

Physical Review A

Year:

2000

Language:

english

File:

PDF, 146 KB

english, 2000

8

AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - UV-Photoreflectance and Raman Characterization of Strain Relaxation in Si on Silicon-Germanium Films

Current, Michael, Chism, Will, Yoo, Woo Sik, Vartanian, Victor, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.

Year:

2011

Language:

english

File:

PDF, 518 KB

english, 2011

9

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Instrumentation, Metrology, and Standards for Nanomanufacturing III - Photo-reflectance characterization of USJ activation in millisecond annealing

Chism, Will, Postek, Michael T., Allgair, John A., Current, Michael, Vartanian, Victor

Year:

2009

Language:

english

File:

PDF, 418 KB

english, 2009

10

Characterization and production metrology of gate dielectric films

Alain C. Diebold, Jesse Canterbury, Will Chism, Curt Richter, Nhan Nguyen, Jim Ehrstein, Chad Weintraub

Journal:

Materials Science in Semiconductor Processing

Year:

2001

Language:

english

File:

PDF, 188 KB

english, 2001

11

Chaotic scattering from hydrogen atoms in a circularly polarized laser field

Okon, Elias, Parker, William, Chism, Will, Reichl, Linda E.

Journal:

Physical Review A

Year:

2002

Language:

english

File:

PDF, 300 KB

english, 2002

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